NHA, V. Q.; THANG, L. V.; THUY LINH, H. T.; GORBACHUK, N. I.; CUONG, N. X. Formation of radiation-disturbed layer in Al/SiO2/n-Si structures irradiated with helium ions with energy 5 MeV. Hue University Journal of Science: Natural Science, [S. l.], v. 129, n. 1D, p. 71-75, 2020. DOI: 10.26459/hueuni-jns.v129i1D.5765. Disponível em: http://222.255.146.83/index.php/hujos-ns/article/view/5765. Acesso em: 15 nov. 2024.